发明名称 |
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME |
摘要 |
Probe head assemblies, components of probe head assemblies, test systems including the probe head assemblies and/or components thereof, and methods of operating the same. The probe head assemblies are configured to convey a plurality of test signals to and/or from a device under test and include a space transformer, a contacting assembly, and a riser that spatially separates the space transformer from the contacting assembly and conveys the plurality of test signals between the space transformer and the contacting assembly. The contacting assembly may include a frame that defines an aperture and has a coefficient of thermal expansion that is within a threshold difference of that of the device under test, a flexible dielectric body that is attached to the frame, maintained in tension by the frame, and extends across the aperture, and a plurality of conductive probes. |
申请公布号 |
WO2012154584(A1) |
申请公布日期 |
2012.11.15 |
申请号 |
WO2012US36601 |
申请日期 |
2012.05.04 |
申请人 |
CASCADE MICROTECH, INC.;DUCKWORTH, KOBY;HILL, ERIC |
发明人 |
DUCKWORTH, KOBY;HILL, ERIC |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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