发明名称 LIGHT DISTRIBUTION PATTERN MEASUREMENT APPARATUS AND HEADLIGHT TESTER HAVING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a light distribution pattern measurement apparatus and a headlight tester which can perform highly accurate measurement even though they are inexpensive. <P>SOLUTION: The light distribution pattern measurement apparatus includes: a mechanism in which a plurality of light-receiving elements 21 that are arranged in a row in a longitudinal direction of the optical axis of light to be measured are arranged in an approximate surface at a position of 10 m from a light source of the light to be measured, and which moves the light-receiving element 21 in a vertical direction of the optical axis of the light to be measured; and a circuit 300 for measuring a light distribution pattern in an approximate surface at a position of 10 m from the light to be measured on the basis of the output of the light-receiving element 21 during movement. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012225801(A) 申请公布日期 2012.11.15
申请号 JP20110094225 申请日期 2011.04.20
申请人 TAKIMOTO KEIKI SEISAKUSHO:KK 发明人 UCHIDA TAKAYUKI
分类号 G01J1/00;G01M11/06 主分类号 G01J1/00
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