发明名称 |
Method for identifying error caused due to plate shock in X-ray tube of computer tomograph, involves deriving measure of strength of plate shock of rotating anode of X-ray tube from spectral selective fluctuation of exposure intensity |
摘要 |
<p>The method involves detecting exposure intensity (B) in detector lines (13a, 13b) in a time-resolved manner while performing a test measurement i.e. empty measurement, by using a computer tomograph (1). Spectral selective fluctuation of the detected intensity with rotating anode frequency and/or integral multiples of the anode frequency is determined. Measure of strength of plate shock of a rotating anode (10) of an X-ray tube (2) of the tomograph is derived from the fluctuation. An error is identified to be caused due to plate shock when the fluctuation exceeds a threshold value. An independent claim is also included for a computer tomograph.</p> |
申请公布号 |
DE102011075804(A1) |
申请公布日期 |
2012.11.15 |
申请号 |
DE20111075804 |
申请日期 |
2011.05.13 |
申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
RAUPACH, RAINER;SEMBRITZKI, OTTO, DR.;RUSCA, NICOLAE, DR. |
分类号 |
H05G1/26 |
主分类号 |
H05G1/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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