发明名称 |
RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a resist composition that can give a resist pattern having an excellent exposure margin and a mask error factor and less generation of defects. <P>SOLUTION: The resist composition contains: (A1) a resin having a structural unit expressed by formula (I); (A2) a resin which is insoluble or poorly soluble with an alkali aqueous solution and can dissolve in an alkali aqueous solution by the action of an acid; (B) an acid generator; and (D) at least one compound selected from the group consisting of a compound expressed by formula (II1) and a compound expressed by formula (II2). <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012226335(A) |
申请公布日期 |
2012.11.15 |
申请号 |
JP20120083474 |
申请日期 |
2012.04.02 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
ICHIKAWA KOJI;SAKAMOTO HIROSHI;MUKAI YUICHI |
分类号 |
G03F7/039;C08F220/28;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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