发明名称 CONTACTLESS IC CARD ISSUE COMMUNICATION INSPECTION MEANS AND IC CARD ISSUE INSPECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To perform efficient inspection which is superior in reliability of card inspection before issue by providing a compact inspection environment of small interference of a magnetic field in an inspection system environment. <P>SOLUTION: Contactless IC card issue communication inspection means is characterized in: a communication inspection table C on which a contactless IC card 20 to be issued is mounted; card communication inspection means having a plurality of communication inspection parts A arranged adjacently to one another, the communication inspection parts A each including a communication antenna 11 which is arranged opposite above the IC card 20 and communicates with the IC card 20 and a reader writer part for inspection which is connected to the communication antenna 11 and performs reading from and inspection writing to the IC card; interposing an electromagnetic wave absorption plate B which prevents interference of an electromagnetic wave between the respective communication inspection parts A; and performing communication inspection through communication with an IC memory of the contactless IC card to be issued which is mounted on each communication inspection table C through communication antennas 11 by respective reader writer parts C for inspection of the plurality of communication inspection parts A. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012226576(A) 申请公布日期 2012.11.15
申请号 JP20110093948 申请日期 2011.04.20
申请人 TOPPAN PRINTING CO LTD 发明人 NAMIKI MASAJI;OSAWA TAKEFUMI
分类号 G06K17/00;H05K9/00 主分类号 G06K17/00
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