发明名称 |
METHOD OF SELECTING PROCESS LIQUID, METHOD OF MANUFACTURING MASK BLANK AND METHOD OF MANUFACTURING MASK |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of selecting a suitable process liquid that allows suppression of occurrence of a potential mask blank defect that results in a micro-black defect in a mask. <P>SOLUTION: A method of selecting a process liquid includes: a step 1 of preparing a plurality of mask blanks each having a thin film serving as a transfer pattern made of a material that can be subjected to dry etching; a step 2 of preparing a plurality of types of process liquids containing etching inhibitors of different concentrations; a step 3 of performing a surface treatment using the process liquids; a step 4 of subjecting the surface-treated mask blank to dry etching for removal, and then obtaining several pieces of surface form information of a substrate surface after etching; a step 5 of selecting surface form information satisfying a desired specification or quality from a corresponding relation between the concentrations of the etching inhibitors and the several pieces of surface form information of the substrate surface, to specify a corresponding concentration of the etching inhibitor; and a step 6 of selecting a process liquid having the specified concentration as a process liquid used for a surface treatment of the mask blank. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012226315(A) |
申请公布日期 |
2012.11.15 |
申请号 |
JP20120061927 |
申请日期 |
2012.03.19 |
申请人 |
HOYA CORP |
发明人 |
YAMADA TAKAYUKI;SUZUKI TOSHIYUKI;HASHIMOTO MASAHIRO;YOKOYA YASUNORI |
分类号 |
G03F1/54;G03F1/82;H01L21/3065 |
主分类号 |
G03F1/54 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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