| 摘要 |
<P>PROBLEM TO BE SOLVED: To suppress an increase in physical size of a second chip while improving data reliability of a semiconductor device including a first chip having storage means and the second chip including instruction means of instructing the storage means to read memory data out and determination means of determining reliability of read-out control data at least by majority decision. <P>SOLUTION: Each piece of control data is stored in three different addresses as memory data to which check data corresponding to a part of an address of a storage destination is added. Parts of respective addresses associated with one piece of control data except parts corresponding to check data are mutually different, and the same among a plurality of pieces of control data. Further, control data, check data, and parts of addresses corresponding to the check data are the same or in relation of mirror inversion with respect to three pieces of memory data. <P>COPYRIGHT: (C)2013,JPO&INPIT |
