发明名称 Liner Formation in 3DIC Structures
摘要 An integrated circuit structure includes a semiconductor substrate; a through-semiconductor via (TSV) opening extending into the semiconductor substrate; and a TSV liner in the TSV opening. The TSV liner includes a sidewall portion on a sidewall of the TSV opening and a bottom portion at a bottom of the TSV opening. The bottom portion of the TSV liner has a bottom height greater than a middle thickness of the sidewall portion of the TSV liner.
申请公布号 US2012289062(A1) 申请公布日期 2012.11.15
申请号 US201213562101 申请日期 2012.07.30
申请人 LO CHING-YU;TU HUNG-JUNG;CHEN HAI-CHING;BAO TIEN-I;CHIOU WEN-CHIH;YU CHEN-HUA;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LO CHING-YU;TU HUNG-JUNG;CHEN HAI-CHING;BAO TIEN-I;CHIOU WEN-CHIH;YU CHEN-HUA
分类号 H01L21/71 主分类号 H01L21/71
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