发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device which has flexibility and resistance to physical change such as bending, and to provide a method of manufacturing the semiconductor device. <P>SOLUTION: A semiconductor device comprises: a plurality of transistors provided on a flexible substrate which has a semiconductor film, a gate electrode provided over the semiconductor film with a gate insulating film, and an interlayer insulating film provided to cover the gate electrode; and a bending portion provided between the plurality of transistors. The bending portion is provided by filling an opening formed in the interlayer insulating film with material having a lower elastic modulus than that of the interlayer insulating film. In addition, material having a lower glass transition point than that of the interlayer insulating film or material having plasticity can be provided as material with which the opening is filled. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012227530(A) 申请公布日期 2012.11.15
申请号 JP20120122742 申请日期 2012.05.30
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KOYAMA JUN;ORIKI KOJI;OKAZAKI SUSUMU;MORIYA YOSHITAKA;YAMAZAKI SHUNPEI
分类号 H01L27/12;G06K19/077;H01L21/02;H01L21/336;H01L21/76;H01L21/762;H01L27/08;H01L29/786;H01L51/50;H05B33/02 主分类号 H01L27/12
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