| 摘要 |
This invention relates to a low light imaging sensors and particularly image intensification and CMOS sensors. To overcome issues of dazzle and halo when operating in areas where the scene encompasses bright light sources, the invention provides material layers in contact with the detector material to spatially limit the generation or subsequent diffusion of electrons in said detector material. This allows the imaging sensor to perform as normal under bright conditions, maintaining the operator's scene awareness and spatial acuity. |
