发明名称 Method of fabricating oxide material layer with openings attached to device layers
摘要 A manufacturing method of a semiconductor structure includes providing a substrate having an upper surface and a bottom surface. First openings are formed in the substrate. An oxidization process is performed to oxidize the substrate having the first openings therein to form an oxide-containing material layer, and the oxide-containing material layer has second openings therein. A conductive material is filled into the second openings to form conductive plugs. A first device layer is formed a first surface of the oxide-containing material layer, and is partially or fully electrically connected to the conductive plugs. A second device layer is formed on a second surface of the oxide-containing material layer, and is partially or fully electrically connected to the conductive plugs.
申请公布号 US8309402(B2) 申请公布日期 2012.11.13
申请号 US201113270199 申请日期 2011.10.10
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 LIN CHA-HSIN;KU TZU-KUN
分类号 H01L21/00;H01L23/12 主分类号 H01L21/00
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