| 摘要 |
A connecting device for connecting pins of a DIP chip to a test device comprises two each of half frames, columns of testing pins, connecting screws, fixing screws, and four holding plates. The two columns of testing pins are arranged respectively on the two half frames parallel to the lengthways direction of the half frame. The distance between two adjacent testing pins in the same column is equal to that between the two adjacent pins in the same column of the DIP chip. The two connecting screws screw into the half frames perpendicular to the lengthways direction of the half frame. Two of the holding plates extend down from each of the half frames and are aligned with short sides of the corresponding half frame. The fixing screws fix the two holding plates on the same half frame along a direction parallel to the lengthways direction of the half frame. |
