System and devices for improving external cavity diode lasers using wavelength and mode sensors and compact optical paths

摘要

External cavity laser (ECL) systems and methods for measuring the wavelength of the ECL by using a portion of the positional light received by the position sensitive detector (PSD) to determine the position of a wavelength tuning element (such as a diffraction grating or an etalon), for determining the longitudinal laser mode or power output of the laser from a portion of the laser light received by a beam-shearing mode sensor, and by using a non-output beam(s) from a transmissive diffraction grating in the ECL to monitor the external cavity laser.