| 摘要 |
A inspection system for medical devices includes an inspection station, a workstation and a database. The inspection system collects images of the medical device. Analysis of the images reveals whether there is a defect in the medical device. If there is a defect, then a comparison analysis is performed between the defect and information in the database. The comparison analysis produces an indication of whether the medical device should be rejected in view of the defect or accepted in spite of the defect.
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