发明名称 Compact scanning electron microscope
摘要 A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.
申请公布号 US8309921(B2) 申请公布日期 2012.11.13
申请号 US201113019216 申请日期 2011.02.01
申请人 BIERHOFF MARTINUS PETRUS MARIA;BUIJSSE BART;KOOIJMAN CORNELIS SANDER;VAN LEEUWEN HUGO;TAPPEL HENDRIK GEZINUS;SANFORD COLIN AUGUST;STOKS SANDER RICHARD MARIE;BERGER STEVEN;BORMANS BEN JACOBUS MARIE;DRIESSEN KOEN ARNOLDUS WILHELMUS;PERSOON JOHANNES ANTONIUS HENDRICUS W. G.;FEI COMPANY 发明人 BIERHOFF MARTINUS PETRUS MARIA;BUIJSSE BART;KOOIJMAN CORNELIS SANDER;VAN LEEUWEN HUGO;TAPPEL HENDRIK GEZINUS;SANFORD COLIN AUGUST;STOKS SANDER RICHARD MARIE;BERGER STEVEN;BORMANS BEN JACOBUS MARIE;DRIESSEN KOEN ARNOLDUS WILHELMUS;PERSOON JOHANNES ANTONIUS HENDRICUS W. G.
分类号 H01J37/20;H01J37/252;H01J37/28 主分类号 H01J37/20
代理机构 代理人
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