发明名称 L1-optimized AAM alignment
摘要 An Active Appearance Model, AAM, uses an L1 minimization-based approach to aligning an input test image. In each iterative application of its statistical model fitting function, a shape parameter coefficient p and an appearance parameter coefficient λ within the statistical model fitting function are updated by L1 minimization. The AAM further includes a canonical classifier to determine if an aligned image is a true example of the class of object being sought before the AAM is permitted to output its aligned image.
申请公布号 US8311319(B2) 申请公布日期 2012.11.13
申请号 US20100961347 申请日期 2010.12.06
申请人 SHIELL DEREK;XIAO JING;SEIKO EPSON CORPORATION 发明人 SHIELL DEREK;XIAO JING
分类号 G06K9/00;G06F15/18;G06T17/00 主分类号 G06K9/00
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