| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection system, in which a circuit board itself can be inspected with the same tester without being affected by a device to be inspected, and which does not require an additional device to be designed and manufactured, when inspecting a circuit board used for inspecting a semiconductor integrated circuit device as the device to be inspected with a tester. <P>SOLUTION: In an inspection system, a communication device on a circuit board can be directly inspected with a tester by providing a selector circuit part and a short circuit part for bypassing an integrated circuit part inside a semiconductor integrated circuit device as a device to be inspected. In this situation, inspection of the circuit board is enabled by simply switching an internal circuit state of the device to be inspected, while using the same constitution as the one employed in inspecting the device to be inspected. <P>COPYRIGHT: (C)2013,JPO&INPIT |
