发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing method, a substrate processing method and a substrate processing apparatus, which can improve a deposition rate and productivity even at a lower temperature. <P>SOLUTION: A semiconductor device manufacturing method includes forming a silicon oxide film of a predetermined film thickness on a substrate by alternately and repeatedly performing: a process of forming a silicon containing layer on the substrate by supplying a material gas to the substrate housed in a processing chamber and heated to a first temperature; and a process of producing reactive species containing oxygen by reaction of an oxygen containing gas and a hydrogen containing gas in a reaction preliminary chamber being heated to a second temperature higher than the first temperature and under a pressure less than an atmospheric pressure, and supplying the reactive species to the substrate heated to the first temperature in the processing chamber under a pressure atmosphere less than the atmospheric pressure to oxidize and convert the silicon containing layer formed on the substrate to a silicon oxide layer. In the process of changing the silicon containing layer to the silicon oxide layer, the silicon containing layer is oxidized under a hydrogen containing gas rich condition. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012221978(A) |
申请公布日期 |
2012.11.12 |
申请号 |
JP20110082662 |
申请日期 |
2011.04.04 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
YUASA KAZUHIRO;YAMAMOTO TAKAHARU |
分类号 |
H01L21/316;C23C16/42;H01L21/31 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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