| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device that allows reduction of power consumption in test operation. <P>SOLUTION: A semiconductor device comprises: a first terminal which receives an external clock signal; a clock generation circuit connected to the first terminal, which generates an internal clock signal according to the external clock signal; a plurality of word lines; a plurality of bit lines; a plurality of amplifier circuits which are respectively connected to the plurality of bit lines; and a control part. In test operation, the control part performs control, for a first period, so that one or a plurality of word lines out of the plurality of word lines are repeatedly switched to a selected state or a non-selected state according to the internal clock signal; and keeps the plurality of amplifier circuits in an active state for the first period. In normal operation, the control part performs control so that the plurality of amplifier circuits are switched between an active status and an inactive state according to switching of one or plurality of word lines out of the plurality of word lines between a selected state and a non-selected state. <P>COPYRIGHT: (C)2013,JPO&INPIT |
