| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an easy and accurate method and device for measuring unevenness of reflected light, capable of evaluating unevenness characteristics of glossiness from a sample surface. <P>SOLUTION: A method for measuring unevenness of reflected light comprises the steps of: transmitting parallel incident light beams to a sample, receiving the light beams for measurement of the surface of the sample by a telecentric optical system, rotating the optical axis of the light beam transmitting step and/or the optical axis of the light beam receiving step around a point in the sample as a center so as to set an arbitrary angle relative to the normal of the sample, and measuring the distribution of the reflected light beams from the sample. <P>COPYRIGHT: (C)2013,JPO&INPIT |
