发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device which improves performances of both of n-type and p-type transistors while inhibiting complication of a manufacturing process. <P>SOLUTION: A semiconductor substrate equipped with an n-type MOS transistor and a p-type MOS transistor in a plane of a semiconductor substrate 1 comprises: first insulation layers 3a isolatedly separating first diffusion layers 2a on which the n-type MOS transistor is formed; and second insulation layers 3b isolatedly separating second diffusion layers 2c on which the p-type MOS transistor is formed. The first insulation layer 3a is formed by embedding a silicon nitride film 5 and a silicon oxide film 6 on the silicon nitride film 5 in a first groove 4a formed on a surface of the semiconductor substrate 1. The second insulation layer 3b is formed by embedding the silicon oxide film 6 in a second groove 4b formed on the surface of the semiconductor substrate 1 so as to become wider than the first groove 4a. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012222278(A) 申请公布日期 2012.11.12
申请号 JP20110089056 申请日期 2011.04.13
申请人 ELPIDA MEMORY INC 发明人 NAKAMORI TOSHIYA
分类号 H01L21/8238;H01L21/76;H01L27/08;H01L27/092 主分类号 H01L21/8238
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