| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device test system and device testing method for efficiently performing module replacement work of a device to be tested by unitarily managing information about the device to be tested. <P>SOLUTION: The device test system relating to this invention is a device test system for testing a device to be tested including one or more replaceable components. The device to be tested and each component have an identification information acquiring part having an RFID tag including identification information for identifying the device to be tested and each component to acquire the identification information from the RFID tag, a test result acquiring part for acquiring a test result for the device to be tested, a stock information acquiring part for acquiring stock information of a component corresponding to the acquired identification information, a history information acquiring part for acquiring replacement history information of the component corresponding to the acquired identification information, and an integrated information generating part for generating integrated information obtained by integrating the acquired identification information, test result, stock information and replacement history information. <P>COPYRIGHT: (C)2013,JPO&INPIT |
