发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND MALFUNCTION PREVENTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide means capable of monitoring a power supply state during a real system operation. <P>SOLUTION: A semiconductor integrated circuit comprises: an oscillator 14; a ring oscillator 11 having an oscillating frequency varying depending on a power supply voltage; an interval timer 13 measuring a predetermined determination period based on a signal of the oscillator 14; a frequency measurement counter 12 measuring an oscillating frequency oscillated by the ring oscillator 11 during the determination period; a nonvolatile memory 15 holding an upper limit value and a lower limit value of the oscillating frequency; and a voltage determination circuit 16 determining whether the oscillating frequency measured by the counter is within a range of a determination code of an upper limit voltage/lower limit voltage held by the nonvolatile memory 15 to output the determination result. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012222192(A) 申请公布日期 2012.11.12
申请号 JP20110087252 申请日期 2011.04.11
申请人 RENESAS ELECTRONICS CORP 发明人 TSUJI NOBUHIRO
分类号 H01L21/822;G01R31/28;G06F1/04;G06F1/28;H01L27/04 主分类号 H01L21/822
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