发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device that can prevent breakdown due to reverse connection of a bias power supply and can set the standard value of an inter-gate-source voltage to be high. <P>SOLUTION: In a semiconductor device, a drain electrode, a source electrode, and a gate electrode of a sub MOS transistor are connected to a drain electrode, a gate electrode, and a source electrode of a main MOS transistor, respectively. The reverse breakdown voltage of a peripheral pn junction diode, which is formed between a base region and a guard ring, of the sub MOS transistor is higher than that of the main MOS transistor. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012216705(A) 申请公布日期 2012.11.08
申请号 JP20110081635 申请日期 2011.04.01
申请人 SANKEN ELECTRIC CO LTD 发明人 SUZUKI TSUKASA
分类号 H01L29/78;H01L27/04;H01L29/06 主分类号 H01L29/78
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