发明名称 MULTI-NANOMETER-PROJECTION APPARATUS FOR LITHOGRAPHY, OXIDATION, INSPECTION, AND MEASUREMENT
摘要 An apparatus, method for manufacturing the apparatus, and method for processing a substrate using the apparatus are disclosed. An exemplary apparatus includes a substrate having a plurality of cells, wherein each cell includes a cell structure. The cell structure includes a piezoelectric film portion and a tip disposed over the piezoelectric film portion. The tip is physically coupled with the piezoelectric film portion.
申请公布号 US2012280333(A1) 申请公布日期 2012.11.08
申请号 US201113101443 申请日期 2011.05.05
申请人 TSAI FEI-GWO;YU CHWEN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TSAI FEI-GWO;YU CHWEN
分类号 H01L29/84;H01L41/22 主分类号 H01L29/84
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