发明名称 |
MULTI-NANOMETER-PROJECTION APPARATUS FOR LITHOGRAPHY, OXIDATION, INSPECTION, AND MEASUREMENT |
摘要 |
An apparatus, method for manufacturing the apparatus, and method for processing a substrate using the apparatus are disclosed. An exemplary apparatus includes a substrate having a plurality of cells, wherein each cell includes a cell structure. The cell structure includes a piezoelectric film portion and a tip disposed over the piezoelectric film portion. The tip is physically coupled with the piezoelectric film portion.
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申请公布号 |
US2012280333(A1) |
申请公布日期 |
2012.11.08 |
申请号 |
US201113101443 |
申请日期 |
2011.05.05 |
申请人 |
TSAI FEI-GWO;YU CHWEN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
TSAI FEI-GWO;YU CHWEN |
分类号 |
H01L29/84;H01L41/22 |
主分类号 |
H01L29/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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