THREE-DIMENSIONAL MEASURING APPARATUS AND THREE-DIMENSIONAL MEASURING METHOD

摘要

PROBLEM TO BE SOLVED: To perform three-dimensional measurement of a stationary object by an intensity-modulated pattern light projection technique, such as optimum pattern light projection.

SOLUTION: A three-dimensional measuring apparatus comprises a pattern projector 21 that projects pattern light on a work piece W, a total illuminator 22, and a data processor 42 that processes data of images picked up by cameras 23 and 24 that pick up images by photographing the work piece W on which the pattern light is projected. A first imaging mode in which images are picked up under projection of the pattern light by the pattern projector 21 and a second imaging mode in which total illumination reflecting images under illumination by the total illuminator 22 are determined by identifying the type of the work piece W. Since three-dimensional information is calculated according to the imaging results, highly accurate three-dimensional information can be obtained.

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