发明名称 LOCAL INTERCONNECT STRUCTURE SELF-ALIGNED TO GATE STRUCTURE
摘要 A common cut mask is employed to define a gate pattern and a local interconnect pattern so that local interconnect structures and gate structures are formed with zero overlay variation relative to one another. A local interconnect structure may be laterally spaced from a gate structure in a first horizontal direction, and contact another gate structure in a second horizontal direction that is different from the first horizontal direction. Further, a gate structure may be formed to be collinear with a local interconnect structure that adjoins the gate structure. The local interconnect structures and the gate structures are formed by a common damascene processing step so that the top surfaces of the gate structures and the local interconnect structures are coplanar with each other.
申请公布号 US2012280290(A1) 申请公布日期 2012.11.08
申请号 US201113102073 申请日期 2011.05.06
申请人 KHAKIFIROOZ ALI;CHENG KANGGUO;DORIS BRUCE B.;HAENSCH WILFRIED E.;HARAN BALASUBRAMANIAN S.;KULKARNI PRANITA;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KHAKIFIROOZ ALI;CHENG KANGGUO;DORIS BRUCE B.;HAENSCH WILFRIED E.;HARAN BALASUBRAMANIAN S.;KULKARNI PRANITA
分类号 H01L29/772;H01L21/28 主分类号 H01L29/772
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