发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device that adopts a wiring structure having resistance to heat (process) and allows prevention of the occurrence of deposition on wiring. <P>SOLUTION: A semiconductor device comprises: a wiring pattern that is connected to a semiconductor device main body and contains a gold material; a connection terminal whose one end side is connected to the wiring pattern and contains the gold material; and an insulator that covers the semiconductor device main body, the wiring pattern, and the connection terminal. The semiconductor device further comprises a planar silicide body whose one surface is in contact with one surface of the wiring pattern or the connection terminal and whose other surface is in contact with the insulator. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012216719(A) 申请公布日期 2012.11.08
申请号 JP20110081917 申请日期 2011.04.01
申请人 YOKOGAWA ELECTRIC CORP 发明人 YATABE CHIKARA
分类号 H01L21/3205;H01L21/28;H01L21/768;H01L23/522;H01L23/532 主分类号 H01L21/3205
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