发明名称 ELECTRON BEAM DRAWING METHOD, ELECTRON BEAM DRAWING SYSTEM, METHOD FOR MANUFACTURING CONCAVO-CONVEX PATTERN CARRIER, AND METHOD FOR MANUFACTURING MAGNETIC DISK MEDIUM
摘要 <P>PROBLEM TO BE SOLVED: To carry out an electron beam drawing process for obtaining a resist pattern in accordance with a fine pattern drawn by correcting dimensional changes caused by time delay to PEB (post exposure baking). <P>SOLUTION: An electron beam drawing method for drawing a fine pattern including a servo pattern and a groove pattern is provided. In the method, when irradiation time of an electron beam EB is controlled by an on-off signal applied to blanking means 26 that blocks the electron beam EB, exposure luminous energy on a resist 11 is controlled by changing a duty ratio in the irradiation of the electron beam EB by an on-off signal for each drawing radius in each pattern based on sensitivity variation data of the resist 11 with respect to the lapse of time after exposure on the pattern. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012216260(A) 申请公布日期 2012.11.08
申请号 JP20110080181 申请日期 2011.03.31
申请人 FUJIFILM CORP 发明人 TAKANO YUKIO
分类号 G11B5/84;G03F7/20;H01L21/027 主分类号 G11B5/84
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