发明名称 |
ELECTRON BEAM DRAWING METHOD, ELECTRON BEAM DRAWING SYSTEM, METHOD FOR MANUFACTURING CONCAVO-CONVEX PATTERN CARRIER, AND METHOD FOR MANUFACTURING MAGNETIC DISK MEDIUM |
摘要 |
<P>PROBLEM TO BE SOLVED: To carry out an electron beam drawing process for obtaining a resist pattern in accordance with a fine pattern drawn by correcting dimensional changes caused by time delay to PEB (post exposure baking). <P>SOLUTION: An electron beam drawing method for drawing a fine pattern including a servo pattern and a groove pattern is provided. In the method, when irradiation time of an electron beam EB is controlled by an on-off signal applied to blanking means 26 that blocks the electron beam EB, exposure luminous energy on a resist 11 is controlled by changing a duty ratio in the irradiation of the electron beam EB by an on-off signal for each drawing radius in each pattern based on sensitivity variation data of the resist 11 with respect to the lapse of time after exposure on the pattern. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012216260(A) |
申请公布日期 |
2012.11.08 |
申请号 |
JP20110080181 |
申请日期 |
2011.03.31 |
申请人 |
FUJIFILM CORP |
发明人 |
TAKANO YUKIO |
分类号 |
G11B5/84;G03F7/20;H01L21/027 |
主分类号 |
G11B5/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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