| 摘要 |
A full duplex, high speed test interface comprises a tester side circuit and a device under test side circuit, each comprising balancing circuits. The balancing circuit of the test side circuit is configured to cancel its own transmitted data at the test side circuit such that the transmitted data does not influence any other signal generated at the test side circuit. Similarly, the balancing circuit of the device under test side circuit is configured to cancel its own transmitted data at the device under test side circuit such that the transmitted data does not influence any other signal generated at the device under test side circuit. |
