发明名称 Nonvolatile variable resistance memory element writing method, and nonvolatile variable resistance memory device
摘要 To provide a variable resistance element writing method that, even when a variable resistance element has a possibility of becoming a half LR state, can ensure a maximum resistance change window by correcting the variable resistance element to a normal low resistance state. In a method of writing data to a variable resistance element (10a) that reversibly changes between a high resistance state and a low resistance state according to a polarity of an applied voltage, as a voltage applied to an upper electrode (11) with respect to a lower electrode (14t): a positive voltage is applied in a high resistance writing step (405) to set the variable resistance element (10a) to a high resistance state (401); a negative voltage is applied in a low resistance writing step (406, 408) to set the variable resistance element (10a) to a low resistance state (403, 402); and a positive voltage is applied in a low resistance stabilization writing step (404) after the negative voltage is applied in the low resistance writing step (408), thereby setting the variable resistance element (10a) through the low resistance state to the high resistance state (401).
申请公布号 US8305795(B2) 申请公布日期 2012.11.06
申请号 US20100999019 申请日期 2010.04.27
申请人 AZUMA RYOTARO;SHIMAKAWA KAZUHIKO;MURAOKA SHUNSAKU;KAWAI KEN;PANASONIC CORPORATION 发明人 AZUMA RYOTARO;SHIMAKAWA KAZUHIKO;MURAOKA SHUNSAKU;KAWAI KEN
分类号 G11C11/00 主分类号 G11C11/00
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