发明名称 Semiconductor device and method for forming the same
摘要 <p>PURPOSE: A semiconductor device and a forming method thereof are provided to improve a property of a semiconductor device by increasing the width of a gate electrode buried in a second trench to reduce a gate resistance. CONSTITUTION: A gate electrode(104) is buried in a trench(102). A sealing insulation layer(106) is formed on the upper side of the gate electrode. A conductive pad(111) is formed on the upper side of the sealing insulation layer. A bit line(114) is connected to the conductive pad. An interlayer insulation layer(112) electrically separates the bit line from a storage electrode contact plug.</p>
申请公布号 KR20120120793(A) 申请公布日期 2012.11.02
申请号 KR20110038559 申请日期 2011.04.25
申请人 发明人
分类号 H01L27/108;H01L21/336;H01L21/8242;H01L29/78 主分类号 H01L27/108
代理机构 代理人
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