| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an active matrix substrate, a display device, a method for inspecting an active matrix substrate, and a method for inspecting a display device that are each capable of ensuring, with a simple configuration, detection of short circuit generated between connecting wirings which are adjacent to each other formed in each of a plurality of layers. <P>SOLUTION: The active matrix substrate includes: first inspection wirings 70 and 75 through which an inspection signal can be input to ones of first switching elements 69 and 74, the ones not being adjacent to each other, and through which an inspection signal can be input to ones of second switching elements 69 and 74, the ones not being adjacent to each other; and second inspection wirings 72 and 77 through which an inspection signal can be input to ones of the first switching elements 69 and 74, the ones not being adjacent to each other and not being connected to the first inspection wirings, and through which an inspection signal can be input to ones of the second switching elements 69 and 74, the ones not being adjacent to each other and not being connected to the first inspection wirings. <P>COPYRIGHT: (C)2013,JPO&INPIT |
