发明名称 LASER MICROSCOPE AND OBSERVATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a laser microscope capable of acquiring a bright fluorescent image at a deep position of a sample while preventing damage to the sample and saturation of brightness even for the sample having an uneven surface shape. <P>SOLUTION: A laser microscope 1 comprises: a laser source 11 for emitting laser light; an object lens 15 for focusing the laser light on a sample A; a scanner 14 for making the laser light scan in a direction orthogonal to the optical axis of the object lens 15; a Z controller 16 for adjusting the depth of a light focus position of the laser light in the sample A; a detector 17 for detecting fluorescent light emitted from the sample A; an AOTF 12 for adjusting the intensity of the laser light emitted from the laser source 11; and a control unit 19 for controlling the above-described components. The laser microscope 1 acquires cross-sectional images of the sample A sequentially in the depth direction from the surface of the sample A, and adjusts an intensity distribution of the laser light in the cross-sectional images of the sample A to be next acquired on the basis of the intensity distribution of the fluorescent light in the cross-sectional images of the sample A acquired in the past. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012212133(A) 申请公布日期 2012.11.01
申请号 JP20120060325 申请日期 2012.03.16
申请人 OLYMPUS CORP 发明人 KIMURA KEIJI;MORITA KAZUHIRO
分类号 G02B21/00;G01N21/64 主分类号 G02B21/00
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