发明名称 SEMICONDUCTOR MEMORY DEVICE AND REPAIR METHOD THEREOF
摘要 A semiconductor memory device includes at least one first semiconductor chip including a plurality of memory cells and a second semiconductor chip including a fuse circuit configured to repair defective cells among the memory cells of the at least one first semiconductor chip.
申请公布号 US2012273843(A1) 申请公布日期 2012.11.01
申请号 US201113205780 申请日期 2011.08.09
申请人 KIM SAENG-HWAN 发明人 KIM SAENG-HWAN
分类号 H01L23/525;H01L21/30 主分类号 H01L23/525
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