TEST CIRCUIT AND METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

A test circuit of a semiconductor integrated circuit includes a through via, a voltage driving unit, and a determination unit. The through via receives an input voltage. The voltage driving unit is connected to the through via to receive the input voltage, changes a level of the input voltage in response to a test control signal, and generates a test voltage. The determination unit compares the input voltage with the test voltage to outputs a resultant signal.