发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a semiconductor device is provided to reduce power consumption and increase an operation speed by sufficiently reducing the size of a transistor. CONSTITUTION: An insulation layer(130) is formed on a substrate. A semiconductor layer(144) is formed on the insulation layer. A gate insulation layer(146) is formed on the semiconductor layer. A gate electrode(148) is formed on the gate insulation layer. A source electrode(142a) and a drain electrode(142b) are electrically connected to the semiconductor layer.</p>
申请公布号 KR20120120041(A) 申请公布日期 2012.11.01
申请号 KR20120040755 申请日期 2012.04.19
申请人 发明人
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
代理机构 代理人
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