| 摘要 |
A circuit and method of directly measuring the Single Event Transient (SET) performance of a combinatorial circuit includes a measurement chain. The measurement chain includes a plurality of cells, each in turn including a pair of SR latches, a dual-input inverter, and a target. During measurement and testing, the targets are irradiated, and a pulse signal caused by an SET event is allowed to propagate through the measurement chain only if the pair of SR latches are active at the same time. The pulse signal is latched by the measurement chain, thus allowing the presence of an SET event to be detected. |
