发明名称 A PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
摘要 <p>A parallel radial mirror analyser (PRMA) (700) for facilitating rotationally symmetric detection of charged particles caused by a charged beam incident on a specimen is disclosed. The PRMA comprises a zero-volt equipotential grid (728), and a plurality of electrodes (702, 704, 706, 708, 710, 712, 714, 716, 718, 720, 722) electrically configured to generate corresponding electrostatic fields for deflecting the charged particles in accordance with respective energy levels of the charged particles to exit through the grid (728) to form corresponding second-order focal points on a detector (206). The detector (206) is disposed external to the corresponding electrostatic fields. A related method is also disclosed.</p>
申请公布号 WO2012148358(A1) 申请公布日期 2012.11.01
申请号 WO2012SG00147 申请日期 2012.04.24
申请人 NATIONAL UNIVERSITY OF SINGAPORE;KHURSHEED, ANJAM;HOANG, HUNG QUANG 发明人 KHURSHEED, ANJAM;HOANG, HUNG QUANG
分类号 H01J49/00;G01N23/225 主分类号 H01J49/00
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