发明名称 METHOD FOR LAMINATING SILICON OXIDE FILM AND SILICON NITRIDE FILM, AND FILM FORMING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for laminating a silicon oxide film and a silicon nitride film which can suppress an increase in warpage of a substrate having a laminated structure formed by laminating a silicon oxide film and a silicon nitride film formed therein, even when a lamination number of the silicon oxide film and the silicon nitride film is increased. <P>SOLUTION: In the method for laminating a silicon oxide film 1-1 and a silicon nitride film 2-1 which laminates the silicon oxide film 1-1 and the silicon nitride film 2-1 on a substrate W, a boron is added to a gas forming the silicon nitride film 2. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012212721(A) 申请公布日期 2012.11.01
申请号 JP20110076461 申请日期 2011.03.30
申请人 TOKYO ELECTRON LTD 发明人 ENDO ATSUSHI;KUROKAWA MASATAKE;IRIUDA HIROKI
分类号 H01L21/318;C23C16/42;H01L21/31;H01L21/316 主分类号 H01L21/318
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