发明名称 |
METHOD FOR LAMINATING SILICON OXIDE FILM AND SILICON NITRIDE FILM, AND FILM FORMING APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for laminating a silicon oxide film and a silicon nitride film which can suppress an increase in warpage of a substrate having a laminated structure formed by laminating a silicon oxide film and a silicon nitride film formed therein, even when a lamination number of the silicon oxide film and the silicon nitride film is increased. <P>SOLUTION: In the method for laminating a silicon oxide film 1-1 and a silicon nitride film 2-1 which laminates the silicon oxide film 1-1 and the silicon nitride film 2-1 on a substrate W, a boron is added to a gas forming the silicon nitride film 2. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012212721(A) |
申请公布日期 |
2012.11.01 |
申请号 |
JP20110076461 |
申请日期 |
2011.03.30 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
ENDO ATSUSHI;KUROKAWA MASATAKE;IRIUDA HIROKI |
分类号 |
H01L21/318;C23C16/42;H01L21/31;H01L21/316 |
主分类号 |
H01L21/318 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|