发明名称 AUTOMATIC MEASUREMENT CIRCUIT OF RESISTANCE VALUE, PROCESSING APPARATUS OF RECORDING MEDIUM LOADED WITH THE SAME, AND AUTOMATIC MEASUREMENT METHOD OF RESISTANCE VALUE USING THE AUTOMATIC MEASUREMENT CIRCUIT OF RESISTANCE VALUE
摘要 <P>PROBLEM TO BE SOLVED: To provide an automatic measurement circuit of resistance value capable of precisely measuring the resistance value of a resistor without being effected by variations (initial values, temperature fluctuations, etc.) in individual components that remain connected, to provide a recording medium processing apparatus loaded with the same, and to provide an automatic measurement method of resistance value using the automatic measurement circuit of resistance value. <P>SOLUTION: In the automatic measurement circuit of resistance value, a resistor R2 that performs printing, erasure, recording, reproduction, etc. for a recording medium with a different current value, and a reference resistance R3 that serves as a comparison reference of the resistor R2 are connected in parallel with a switching means 2. Here, a control means 3 controls the same circuit to measure a first potential Va being applied to the resistor R2 when the resistor R2 is turned energized and the reference resistance R3 is turned unenergized and a second potential Vb being applied to the reference resistance R3 when the resistor R2 is turned unenergized and the reference resistance R3 is turned energized, and to measure the resistance value of the resistor R2 on the basis of the potential difference between the first potential Va and the second potential Vb. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012210737(A) 申请公布日期 2012.11.01
申请号 JP20110076760 申请日期 2011.03.30
申请人 NIDEC SANKYO CORP 发明人 YAMAMOTO HISASHI
分类号 B41J2/35;B41J2/32 主分类号 B41J2/35
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