发明名称 |
TFT SUBSTRATE AND METHOD FOR CORRECTING WIRING FAULT ON TFT SUBSTRATE |
摘要 |
<p>Provided are a TFT substrate (10) and a method for correcting a wiring fault on TFT substrate (10), in which correction can be readily performed on the location of a wiring fault. A TFT substrate (10) in which a plurality of gate lines (1) and a plurality of source lines (2) are arranged as a matrix, and a TFT (6) is arranged on at least one intersection region at which a gate line (1) and a source line (2) intersect. At least one of the intersection regions are divided, in the longitudinal direction of a source line (2), by a slit (5) provided to a gate line (1).</p> |
申请公布号 |
WO2012147704(A1) |
申请公布日期 |
2012.11.01 |
申请号 |
WO2012JP60892 |
申请日期 |
2012.04.23 |
申请人 |
SHARP KABUSHIKI KAISHA;SHIOMI, MAKOTO |
发明人 |
SHIOMI, MAKOTO |
分类号 |
G09F9/30;G02F1/1368;G09F9/00;H01L21/3205;H01L21/336;H01L21/768;H01L21/82;H01L23/522;H01L29/786 |
主分类号 |
G09F9/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|