发明名称 |
In-column detector for particle-optical column |
摘要 |
<p>The invention relates to an in-column back-scattered electron detector, the detector placed in a combined electrostatic/magnetic objective lens for a SEM. The detector is formed as a charged particle sensitive surface, preferably a scintillator disk (406) that acts as one of the electrode faces (110) forming the electrostatic focusing field. The photons generated in the scintillator are detected by a photon detector (202, 408), such as a photo-diode or a multipixel photon detector. The objective lens may be equipped with another electron detector (116) for detecting secondary electrons that are kept closer to the axis. A light guide (204, 404) may be used to offer electrical insulation between the photon detector and the scintillator.</p> |
申请公布号 |
EP2518756(A2) |
申请公布日期 |
2012.10.31 |
申请号 |
EP20120165423 |
申请日期 |
2012.04.25 |
申请人 |
FEI COMPANY |
发明人 |
TUMA, LUBOMIR;HLAVENKA, PETR;SYTAR, PETR;CESKA, RADEK;SED'A, BOHUSLAV |
分类号 |
H01J37/145;H01J37/244;H01J37/28 |
主分类号 |
H01J37/145 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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