发明名称 GAS ANALYSIS DEVICE
摘要 The present invention is intended to provide a gas analyzing system that can perform calibration without being influenced by the deterioration of span gas in a span gas supply line, and provided with an open-close device control part 61 that receives a calibration start signal issuing an instruction to start zero calibration and span calibration, and controls an open-close device 31 for a span gas flow path 3 and an open-close device 21 for a zero gas flow path 2, wherein if the open-close device control part 61 receives a new calibration start signal after a predetermined time has passed since previous calibration was performed, before the span calibration is started, for a predetermined time, the open-close device control part 61 controls the open-close device 31 for the span gas flow path 3 so as to open the open-close device 31 for the span gas flow path 3, and thereby purges span gas that remains in the span gas flow path 3.
申请公布号 EP2518466(A1) 申请公布日期 2012.10.31
申请号 EP20100839172 申请日期 2010.12.07
申请人 HORIBA, LTD. 发明人 MIYAI, MASARU;NISHIKAWA, MASAHIRO
分类号 G01N1/00;G01N21/27;G01N21/76 主分类号 G01N1/00
代理机构 代理人
主权项
地址