| 摘要 |
The invention relates to a high-resolution microscope and to a method for determining the two- or three-dimensional positions of objects. The microscope and method includes the following: (a) The vertical (Z) position of imaged particles or molecules being determined from the orientation and shape thereof by means of an anamorphic lens, preferably a cylindrical lens, in the imaging, (b) the detection beam path being split into at least two partial detection beam paths having different optical path lengths, which are detected at an offset on a detector, (c) activation or switchover being performed by means of a multi-photon excitation process, preferably two-photon excitation. The following are also included: (d) a point-scanning activation or switchover, (e) a line-scanning activation or switchover, (f) the sample is excited and the sample light is detected in the wide-field mode, (g) manually or automatically predetermined sample regions are activated or switched over, (h) the activation or switchover is performed by means of AOTF or SLM or DMD, (i) laser pulses for activating or switching are spectrally split by means of a spectrally splitting element, preferably a grating, (j) an SLM or DMD in the beam path after the grating performs a controlled selection of split laser pulse fractions, (k) the laser wide-field excitation is guided by SLM or DMD, (l) ROIs are selected by SLM or DMD, (m) a multi-photon switching or activation is performed by means of a microlens array, preferably a cylindrical lens array, n) switching and/or excitation is performed by means of a line scanner, and (o) a line detection is performed by means of a spatially resolved sensor, wherein at least two sensor rows, each comprising a plurality of sensors, are illuminated with sample light by means of a slit diaphragm position. |
