发明名称 Polymeric compound, positive resist composition, and method of forming resist pattern
摘要 A polymeric compound including a structural unit (a0) represented by the structural unit (a0-1) shown below: (in the formula (a0-1), R1 represents a hydrogen atom, a lower alkyl group, or a halogenated lower alkyl group; R5 represents an alkyl group; R6 represents a substituent selected from the group consisting of an alkyl group, an alkoxy group, a halogen atom and a halogenated alkyl group; and e represents an integer of 0 to 5).
申请公布号 US8298745(B2) 申请公布日期 2012.10.30
申请号 US20080451971 申请日期 2008.06.11
申请人 FURUYA SANAE;DAZAI TAKAHIRO;KOHNO SHINICHI;TOKYO OHKA KOGYO CO., LTD. 发明人 FURUYA SANAE;DAZAI TAKAHIRO;KOHNO SHINICHI
分类号 G03F7/004;C08F32/02;G03F7/30 主分类号 G03F7/004
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