发明名称 Semiconductor structure and method of manufacturing same
摘要 A semiconductor structure and method of manufacturing the semiconductor structure, and more particularly to a semiconductor structure having reduced metal line resistance and a method of manufacturing the same in back end of line (BEOL) processes. The method includes forming a first trench extending to a lower metal layer Mx+1 and forming a second trench remote from the first trench. The method further includes filling the first trench and the second trench with conductive material. The conductive material in the second trench forms a vertical wiring line extending orthogonally and in electrical contact with an upper wiring layer and electrically isolated from lower metal layers including the lower metal layer Mx+1. The vertical wiring line decreases a resistance of a structure.
申请公布号 US8298912(B2) 申请公布日期 2012.10.30
申请号 US201113080326 申请日期 2011.04.05
申请人 LI WAI-KIN;LIN YI-HSIUNG;MATUSIEWICZ GERALD;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LI WAI-KIN;LIN YI-HSIUNG;MATUSIEWICZ GERALD
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
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