发明名称 3D integrated circuit device fabrication using interface wafer as permanent carrier
摘要 A method is provided for fabricating a 3D integrated circuit structure. Provided are an interface wafer including a first wiring layer and through-silicon vias, and a first active circuitry layer wafer including active circuitry. The first active circuitry layer wafer is bonded to the interface wafer. Then, a first portion of the first active circuitry layer wafer is removed such that a second portion remains attached to the interface wafer. A stack structure including the interface wafer and the second portion of the first active circuitry layer wafer is bonded to a base wafer. Next, the interface wafer is thinned so as to form an interface layer, and metallizations coupled through the through-silicon vias in the interface layer to the first wiring layer are formed on the interface layer. Also provided is a tangible computer readable medium encoded with a program that comprises instructions for performing such a method.
申请公布号 US8298914(B2) 申请公布日期 2012.10.30
申请号 US20080194198 申请日期 2008.08.19
申请人 FAROOQ MUKTA G.;HANNON ROBERT;IYER SUBRAMANIAN S.;KOESTER STEVEN J.;LIU FEI;PURUSHOTHAMAN SAMPATH;YOUNG ALBERT M.;YU ROY R.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FAROOQ MUKTA G.;HANNON ROBERT;IYER SUBRAMANIAN S.;KOESTER STEVEN J.;LIU FEI;PURUSHOTHAMAN SAMPATH;YOUNG ALBERT M.;YU ROY R.
分类号 H01L21/4763 主分类号 H01L21/4763
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