发明名称 PROBE USING NANOWIRE AND METHOD THEREFOR
摘要 PURPOSE: A probe using a nano wire and a manufacturing method therefor are provided to manufacture a probe using a single-crystal metal nano probe, thereby measuring electrical properties of the probe without damage on a surface of the probe. CONSTITUTION: Single-crystal metal nano wires(110) are formed on a substrate(100). A mother body(200) contacts the single-crystal metal nano wires. An electronic beam or an ion beam are irradiated onto a portion where the motor body contacts the single-crystal metal nano wires so that bonded mother body are bonded with the single-crystal metal nano wires. The mother body bonded with the single-crystal metal nano wires is separated from the substrate. [Reference numerals] (AA) Detaching from substrate
申请公布号 KR101195202(B1) 申请公布日期 2012.10.29
申请号 KR20110037226 申请日期 2011.04.21
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 AHN, JAE PYOUNG;SEO, JONG HYUN;YOON, SANG WON
分类号 G01Q70/12;G01Q70/14;G01Q70/16 主分类号 G01Q70/12
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