发明名称 |
PROBE USING NANOWIRE AND METHOD THEREFOR |
摘要 |
PURPOSE: A probe using a nano wire and a manufacturing method therefor are provided to manufacture a probe using a single-crystal metal nano probe, thereby measuring electrical properties of the probe without damage on a surface of the probe. CONSTITUTION: Single-crystal metal nano wires(110) are formed on a substrate(100). A mother body(200) contacts the single-crystal metal nano wires. An electronic beam or an ion beam are irradiated onto a portion where the motor body contacts the single-crystal metal nano wires so that bonded mother body are bonded with the single-crystal metal nano wires. The mother body bonded with the single-crystal metal nano wires is separated from the substrate. [Reference numerals] (AA) Detaching from substrate |
申请公布号 |
KR101195202(B1) |
申请公布日期 |
2012.10.29 |
申请号 |
KR20110037226 |
申请日期 |
2011.04.21 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
AHN, JAE PYOUNG;SEO, JONG HYUN;YOON, SANG WON |
分类号 |
G01Q70/12;G01Q70/14;G01Q70/16 |
主分类号 |
G01Q70/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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