发明名称 AN INSPECTION DEVICE
摘要 <p>According to the present invention there is provided an inspection device (1), suitable for use when inspecting a component (5) for defects (35), the inspection device (1) comprising, a cluster of lights (9, 17, 19, 21) which are arranged into two or more groups (11a, lib, 11c, lid) of lights, wherein the cluster of lights is configured such that each group (11a, lib, 11c, lid) of lights can be operated asynchronously to the other group (s) of lights so that light can be directed asynchronously at a component (5), from different directions; an image capturing means (camera 7) which is configured to capture an image of a component (5) when each of the groups of lights are lit, to provide a plurality of images, each image showing the component (5) lit from a different direction; a processing means (23) configured to perform arithmetic computation using the images, so as to provide a single image in which defects in the component can be more easily identified. There is further provided a corresponding method of inspecting a component and a lighting arrangement with a dome and a diffuser.</p>
申请公布号 WO2012143165(A1) 申请公布日期 2012.10.26
申请号 WO2012EP53756 申请日期 2012.03.05
申请人 ISMECA SEMICONDUCTOR HOLDING SA;CRAVEIRO, FRANCO;ABRIAL, PIERRICK;SIA, YAW YOONG 发明人 CRAVEIRO, FRANCO;ABRIAL, PIERRICK;SIA, YAW YOONG
分类号 G01N21/88 主分类号 G01N21/88
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